Amit Kumar Singh
Department of Physics, Marwari College, Lalit Narayan Mithila University, Darbhanga, 846004, Bihar, India.

Ashwani Kumar
Department of Physics, Regional Institute of Education (NCERT), Bhubaneswar, 751022, Odisha, India.

DOI https://doi.org/10.33889/PMSL.2024.3.1.010

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Abstract

This review article describes the various experimental techniques, which are required for the characterization of magnetic thin films. Characterization is an essential process to understand the properties of magnetic thin films. By knowing the properties of these materials, one can utilize them in various technological applications as per requirements. There are different characterization tools to study the different properties of nanostructured materials. Some important experimental techniques employed to characterize the magnetic thin films are: X-Ray Diffraction, X-Ray reflectivity, Field emission scanning electron microscopy, Energy dispersive spectrometer, Transmission electron microscopy, Superconducting quantum interference device, Raman spectroscopy and X-ray absorption spectroscopy etc. These techniques will develop a better understanding of the structural, morphological, and magnetic properties of the materials to the scientific community. The discussion made in the present review article would be extremely helpful to the researchers who are doing research in the various branches of science and engineering.

Keywords- Nanomaterial, XRD, FE-SEM, SQUID, Raman spectroscopy, XAS.

Citation

Singh, A. K., & Kumar, A. (2024). Experimental Techniques for the Characterization of Magnetic Thin Films. Prabha Materials Science Letters, 3(1), 146-174. https://doi.org/10.33889/PMSL.2024.3.1.010.